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    Comparison of the electron-spin-resonance linewidth in multilayered CuMn spin glasses with insulating versus conducting interlayers 

    Leslie-Pelecky, D. L.; VanWijland, F.; Hoff, C. N.; Cowen, J.A.; Gavrina, A.; Chien, C.-L. (American Institute of Physics, 1994-05-15)
    The temperature-dependent electron-spin-resonance linewidth ΔH(T) may be used to investigate the effect of the geometry and interlayer material on the magnetic properties of multilayered systems. We compare ΔH(T) in ...

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    Author
    Chien, C.-L. (1)
    Cowen, J.A. (1)
    Gavrina, A. (1)
    Hoff, C. N. (1)
    Leslie-Pelecky, D. L. (1)
    VanWijland, F. (1)
    Subject
    alumina (1)
    copper alloys (1)
    CuMn-Al2O (1)
    CuMn/Al2O3 multilayers (1)
    electron-spin-resonance linewidth (1)
    freezing temperature (1)
    magnetic multilayers (1)
    magnetic susceptibility (1)
    manganese alloys (1)
    spin glasses (1)... View MoreDate Issued
    1994 (1)
    Has File(s)
    Yes (1)

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