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dc.contributor.authorCheng, X.M.
dc.contributor.authorChien, C.-L.
dc.date.accessioned2016-02-25T21:52:03Z
dc.date.available2016-02-25T21:52:03Z
dc.date.issued2003-05-15
dc.identifier.citationJournal of Applied Physics 15 May 2003, vol.93, no.10, pp. 7876-8en_US
dc.identifier.urihttp://jhir.library.jhu.edu/handle/1774.2/38271
dc.description.abstractEpitaxial ZnO thin films doped with 7% Mn have been made by reactive rf magnetron sputtering onto (112_0) sapphire substrates at 400°C. X-ray diffraction measurements reveal that the Zn0.93Mn0.07O film has a (0001) wurtzite single-crystal structure with a rocking curve width of 0.98°. UV-VIS absorption spectra show a band gap of 3.25 eV for pure ZnO films and 3.31 eV for the Zn0.93Mn0.07O film with states extending into the gap. The Auger electron spectroscopy shows homogeneous distribution of Mn in the film. The magnetic properties of the Zn0.93Mn0.07O film have been measured by a superconducting quantum interference device magnetometer at various temperatures with fields up to 5 T. No ferromagnetic ordering has been observed at temperature at 5 K. Instead, paramagnetic characteristics with a Curie-Weiss behavior have been observed.en_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectzinc compoundsen_US
dc.subjectX-ray-diffractionen_US
dc.subjectvisible spectraen_US
dc.subjectvapour phase epitaxial growthen_US
dc.subject3.25 eVen_US
dc.subjectultraviolet spectraen_US
dc.subjectsputter depositionen_US
dc.subjectsemiconductor epitaxial layersen_US
dc.subjectZnOen_US
dc.subjectZnO:Mnen_US
dc.subjectZn0.93Mn0.07Oen_US
dc.subjectparamagnetic materialsen_US
dc.subjectmanganeseen_US
dc.subjectmagnetic epitaxial layersen_US
dc.subjectII-VI semiconductorsen_US
dc.subjectenergy gapen_US
dc.subjectLuger electron spectraen_US
dc.subjectAl2O3en_US
dc.subjectX-ray diffractionen_US
dc.subjectepitaxial Mn-doped ZnO thin filmsen_US
dc.subjectmagnetic propertiesen_US
dc.subjectreactive rf magnetron sputteringen_US
dc.subject(112_0) sapphire substratesen_US
dc.subjectX-ray diffraction measurementsen_US
dc.subject(0001) wurtzite single-crystal structureen_US
dc.subject(101_2) peaken_US
dc.subject5 T;en_US
dc.subject5 Ken_US
dc.subject400 degCen_US
dc.titleMagnetic properties of epitaxial Mn-doped ZnO thin filmsen_US
dc.typeArticleen_US


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